|Abstract Title:||PM CEMS selection for the Indian 17 Industries Program and Beyond|
|Session Choice:||Monitoring Techniques: Particulate|
|Presenter Name:||Mr Steven Werrell|
Abstract Information :
As time passes, more and more industrial processes in India are being required to continuously
monitor particulate emissions from both primary (main stack) and secondary filters (Baghouses,
Cyclones, ESP's etc).
The ongoing requirements of the 17 Industries Programme for the continuous monitoring of both gas and particulate emissions has led to a wide choice of instruments being introduced to the Indian market offering both different monitoring techniques and type approvals.
This presentation will provide an overview of factors which should be considered when specifying and selecting continuous PM CEMS to allow users the widest choice of appropriate technology choice when selecting an instrument. As no one technology is suitable for all applications, this paper, using real world examples, will provide an unbiased overview of what should be considered by end users and integrators when selecting instrumentation to monitor particulate emissions from chimney stacks. Technology types reviewed in this paper will include both traditional Opacity and Dynamic Opacity cross stack optical techniques, Laser scatter systems including Forward and Backscatter technologies, extractive monitoring for Wet Stacks and Probe Electrification methods Areas covered will include what process data should be considered to ensure the correct technology selection including process filter type, limitations in choice caused by stack configuration and process conditions. In addition, the most appropriate installation points together with potential maintenance considerations, cost of ownership and calibration will be reviewed. Consideration of appropriate type approvals (MCERTS, UBA, and US EPA) will also be discussed.